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MIT optical test system (wafer test)
MIT optical test system (wafer test)
MIT optical test system (wafer test)
MIT optical test system (wafer test)
MIT optical test system (wafer test)

MIT optical test system (wafer test)

Retail price
0.0

 

Characteristic:


 

High strength nylon or polyester fiber is used to provide functional protection for various special industries through professional design, as follows:

 

  • Wafer optical test system, 8&12inch wafers of various materials;
  • Automatic three axis motion control;
  • Wafer loading and unloading, automatic alignment, automatic test;
  • Multifunctional fixture, support 8&12 probe card;
  • Multiple instruments support AOI and optics;

 

Project Specifications
size Length*width*height: 2.84m*1.90m*2.40M
Test sample size 8”&12”wafer
Spectrograph CS-2000A/SR-UL2/PR788/SR3
Camera 43million, high resolution CCD.
Motor system High precision servo motor and high precision ball screw are used
Function Chromaticity, brightness, uniformity, spectrum test support: point, line, surface defect test, mura test.
Signal It supports special instrument made models and market general brand signal machines, supports customized signal, and signal format: TTL / LVDS / Mipi / HDMI / EDP / 2K&4K&8K, etc
Power Supply Support high precision multi-channel DC power output, as well as customized power demand.
Software The software developed by Teyi is all Chinese version, C # programming modularization, easy to operate, UI interface can be customized according to customer needs, the software comes with various standard test methods, and can be tested through direct call mode.

 

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